Applied Microscopy (AM), the official journal of Korean Society of Microscopy (KSM), is an international, peerreviewed journal. The Journal covers all the interdisciplinary fields of technological developments in new microscopy methods and instrumentation and their applications to biological or material science for determination of structure and chemistry.
Applied Microscopy aims to promote communication regarding recent innovative applications and developments in microscopy. Articles in the following categories will be published: Regular articles, Brief reports, Technical reports and Review articles.
Applied Microscopy publishes four issues a year, and is open to scientists and technologists who are related with the fields of development of advanced microscopy in diverse fields and their application to the various scientific issues. Applied Microscopy is an open access journal. Full text is accessible at http://www.appmicro.org. For subscription, submission and all other information visit our website. To subscribe to this Journal or renew your current subscription, please complete the subscription order from and send it to Editorial Office through e-mail (firstname.lastname@example.org). Full text or part of the journal is indexed/tracked/covered by DOI/Cross, KCI, and KISTI.
Korean Journal of Electron Microscopy (ISSN: 1225-6773) was first published in 1969. The tile of the journal changed to Korean Journal of Microscopy (ISSN: 2234-6198) in 1996. To meet the demand for the high quality open access journal in the field of microscopy, The Korean Society of Microscopy started to publish the journal named Applied Microscopy (pISSN: 2287-5123, eISSN: 2287-4445) from Vol. 42, No. 3 in 2012.